第三代
半導(dǎo)體測試家族
Third generation semiconductor testing family
分類
QT-8409PIM high-power dynamic and static comprehensive test system
QT-8409PIM test system, applied to IGBT/SiC power modules, meets dynamic and static parameter testing
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High-speed short-circuit protection |
Low stray |
Flexible tooling |
Suitable for mass production/manual test |
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Type |
QT-8409PIM |
| Advantages |
Industry-leading short-circuit protection speed, effectively protecting the socket; low stray; fast replacement of different packages |
| Main Features |
? Support 4 (DC/AC) stations ? Stray inductance LS<30nH ? AC: SW, TRR, ISC, QG, RBSOA test ? AC @3000A 1500V, ISC 12kA ? DC @2000A 2kV/3kV/6kV/8kV ? Short-circuit protection <1uS ? Test objects: PIM IGBT modules, SiC modules, DBC, three-level products, etc. |
Recommend推薦產(chǎn)品
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中國廣東省佛山市南海國家高新區(qū)新光源產(chǎn)業(yè)基地光明大道16號 |
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0757 83207313 (銷售) |
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0757 83208786 (銷售) |
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info@powertechsemi.com |
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