第三代
半導(dǎo)體測(cè)試家族
Third generation semiconductor testing family
分類
QT-3101 UIL avalanche test
QT-3101 UIL avalanche test is suitable for testing avalanche parameters of MOSFETs, IGBTs and diodes
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Support double DIE |
Fast charging |
Save failure waveform |
Clamp voltage function |
| Type | QT-3101 UIL |
| Advantages |
Support VDD ON(E=1/2L*I*I*BVDSS/(BVDSS-VDD)) or VDD OFF(E=1/2*L*I*I) test Can share a computer with QT-4100B to achieve unified management of test programs and data Single pulse, multi-pulse or dual MOSFET testing can be set Real-time measurement monitors, output current, IDMAX, and Energy readouts The internal resistance of the inductor is low, the ID charging is fast, and the test time is shorter Built-in oscilloscope |
| Main Features |
Support RPF |
Recommend推薦產(chǎn)品
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中國(guó)廣東省佛山市南海國(guó)家高新區(qū)新光源產(chǎn)業(yè)基地光明大道16號(hào) |
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0757 83207313 (銷售) |
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0757 83208786 (銷售) |
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info@powertechsemi.com |
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