第三代
半導(dǎo)體測(cè)試家族
Third generation semiconductor testing family
分類
QT-3102 thermal resistance tester
QT-3102-XX test device type: triode, field effect tube, IGBT, diode
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Support double DIE |
1000W thermal resistance |
Overload and undervoltage protection |
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| Type | QT-3102 |
| Advantages |
QT-3102-XX test device type: triode, field effect tube, IGBT, diode R26: Can be built into the DC test item of QT-4100 to achieve high-power built-in thermal resistance testing R26：Dual Die testing can be implemented through scanbox |
| Main Features |
? The maximum current and maximum voltage depend on the model. The maximum current is 20A and 50A respectively. ? The maximum voltages are 100V and 200V respectively |
Testing standards檢測(cè)標(biāo)準(zhǔn)
Recommend推薦產(chǎn)品
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中國(guó)廣東省佛山市南海國(guó)家高新區(qū)新光源產(chǎn)業(yè)基地光明大道16號(hào) |
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0757 83207313 (銷售) |
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0757 83208786 (銷售) |
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info@powertechsemi.com |
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