第三代
半導(dǎo)體測試家族
Third generation semiconductor testing family
分類
QT-3107 LCR RG/CG test
Self-developed LCR digital bridge supports Mosfet RG/CG testing and can also be used to test the capacitance of diodes with a resolution of 1fF.
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Support double DIE |
High precision and anti-interference |
Fast testing |
Extended 2KV bias |
| Model | QT-3107 |
| Product Advantages |
Using digital bridge, it has strong anti-interference ability and high test accuracy; The test time is 2-3 times faster than the analog bridge; Bias voltage up to 2KV; |
| Key Features |
Test resolution 1fF; Self-equipped with ±100V bias source; Test frequency: 1MHz, extended to 2MHz; Output amplitude: 0.025-2V; |
Testing standards檢測標(biāo)準(zhǔn)
Recommend推薦產(chǎn)品
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中國廣東省佛山市南海國家高新區(qū)新光源產(chǎn)業(yè)基地光明大道16號 |
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0757 83207313 (銷售) |
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0757 83208786 (銷售) |
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info@powertechsemi.com |
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