第三代
半導(dǎo)體測試家族
Third generation semiconductor testing family
分類
KGD (Know Good Die) testing solution
Sustain high temperature and normal temperature testing: DC+SW+UIL+RG&QA; Provide test machine + turret/translation sorting machine matching solution; Provide short circuit protection + self-developed probe
|
Pin card
protection |
Two-DUT test in parallel |
High temperature and normal temperature |
Data merge |
| Model | KGD testing solutions |
| Product Advantages |
Low stray solution Short circuit protection: short circuit shutdown time is less than 300nS Customized socket, adapt to different Handler solutions Special probe material, short circuit test does not melt or stick to foreign matter Support station merging |
|
|
Support test machine + turret solution, high test efficiency |
Recommend推薦產(chǎn)品
|
中國廣東省佛山市南海國家高新區(qū)新光源產(chǎn)業(yè)基地光明大道16號 |
|
0757 83207313 (銷售) |
|
0757 83208786 (銷售) |
|
info@powertechsemi.com |
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